TFT Prototyping Line in MCPF
ToF-SIMS PHI7200 Time-of-flight Secondary Ion Mass Spectrometer Powder X-ray diffractometer-PANalytical
For residue Nickel amount confirmation For characterization of crystallization quality
http://www.mcpf.ust.hk/photos/ae002.jpg http://www.mcpf.ust.hk/photos/de006.jpg
   
MicroRaman / Photoluminescence System Resistivity / Hall Measurement System
For characterization of crystallization quality For Hall mobility measurement
http://www.mcpf.ust.hk/photos/ge002.jpg http://www.mcpf.ust.hk/photos/he001.jpg